The Wide Area Metrology (WAM) system provides continuous monitoring and whole-panel mapping of critical material and process parameters at full production throughput and for 100% of manufactured thin-film solar panels.

According to BrightView, it can be used for any thin-film production line including single-junction and multi-junction silicon, and it enables enhanced average thin-film solar panel efficiency, improve line productivity and verify full compliance with the strictest durability and quality requirements.

InSight is able to measure and map critical layers on-the-fly within the actual product stack, providing continuous process fingerprinting that drives production improvement, excursion detection and line productivity, BrightView says.